An X-ray fluorescence (XRF) spectrometer is an analytical instrument used primarily for non-destructive determination of the elemental composition of materials. By directing high-energy X-rays at a sample, the instrument measures the secondary fluorescent X-rays emitted in response, allowing scientists and industrial technicians to quantify trace elements, identify metal alloys, screen consumer goods for toxic heavy metals, analyze archaeological artifacts, and grade geological ore samples with remarkable speed.